Abstract
In the current work, we studied the effect of type of substrates on the linear and nonlinear refractive index of chalcogenide Se82Te15Bi3.0 thin films. Melt quenching technique has been utilized for the preparation of bulk samples of the examined material. Thin films are deposited on glass, quartz and mica substrates using well-known thermal evaporation technique. The linear refractive index (n) is calculated by Swanepoel method that utilized transmission spectra. Miller’s rule has been exploited to evaluate the nonlinear refractive index (n2). The acquired value of n2 is found to be 12 times greater than pure silica. The more value of linear and nonlinear refractive index makes this material advantageous for various technological applications.
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