Tip-Enhanced Thermal Expansion Force for Nanoscale Chemical Imaging and Spectroscopy in Photoinduced Force Microscopy

Abstract

We investigate the tip-enhanced thermal expansion force for nanoscale chemical imaging and spectroscopy in the tip-sample junction. It is found, both theoretically and experimentally, that the tip-enhanced absorption of the near-field at the tip followed by sample expansion shows characteristic behaviors with respect to the sample thickness and the incident laser pulse width. The van der Waals interaction plays a major role in exerting a force on the tip from the thermally expanded sample. The force behavior of the photoinduced force microscope (PiFM) is compared with that of the existing photothermal-induced resonance technique (PTIR) to unravel the ambiguous thermal expansion force mechanism. The present study opens up new opportunities for enhancing the performance of optical nanoscopy and spectroscopy such as chemical imaging of nanobiomaterials and the local field mapping of photonic devices, including surface polaritons on van der Waals materials with the assistance of the thermal expansion of a functionalized tip.