Abstract
Far-field Raman spectroscopy and tip-enhanced Raman spectroscopy were used to investigate 20-nm-thick amorphous carbon films and 3-nm-thick carbon overcoats of commercial hard disk drives. Enhancement of the Raman signal on both samples was observed indicating the activation of surface plasmons. The largest enhancement was found for the 3-nm-thick carbon overcoat of a commercial hard disk suggesting that the chemistry of nanometer-thick carbon films can be studied using tip-enhanced Raman spectroscopy with high sensitivity and resolution.
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