Abstract
On the linear accelerator of helium ions, the irradiation of TiO2-2 samples with ions energy of 0.12 and 4 MeV to doses of ≈ 1∙1018 ion/cm2 is executed. The elemental composition of TiO2-2 samples is made by roentgenfluorescence method. After irradiation a change of electrophysical characteristics is investigated, microscopic researches on electronic and optical microscopes are conducted. Numerical calculations of atom sputtering ratios taking into account of input angles of helium ions in a sample, and also phonons formation, atoms redistribution (segregation), appearance of the vacancies and displacements in TiO2-2 sample are made. Processes of the flaking formation are investigated, and also presence of the metallization effect and long-range interaction effect in the irradiated samples is shown
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