Abstract

This paper investigates the buckling behavior of piezoelectric nanowires under distributed transverse loading, within the framework of the Timoshenko beam theory, and in the presence of surface effects. Analytical relations are given for the critical force of axial buckling of nanowires by accounting for the effects of surface elasticity, residual surface tension, and transverse shear deformation. Through an example, it is shown that the critical electric potential of buckling depends on both the surface stresses and piezoelectricity. This study may be helpful in the characterization of the mechanical properties of nanowires and in the calibration of the nanowire-based force sensors.

Highlights

  • Nanowires have attracted considerable attention in the literature for future applications as sensors, actuators, transistors, and resonators in nanoelectromechanical systems and in biotechnology [1]

  • By conducting bending tests using atomic force microscopy, Cuenot et al [4] have demonstrated that the stiffness of nanowires is size-dependent, and this phenomenon has been theoretically explained by considering the surface effects [5,6,7,8]

  • The objective of the present paper is to investigate the combined surface and piezoelectric effects on the buckling of piezoelectric nanowires using the modified Timoshenko beam model

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Summary

Introduction

Nanowires have attracted considerable attention in the literature for future applications as sensors, actuators, transistors, and resonators in nanoelectromechanical systems and in biotechnology [1]. By conducting bending tests using atomic force microscopy, Cuenot et al [4] have demonstrated that the stiffness of nanowires is size-dependent, and this phenomenon has been theoretically explained by considering the surface effects [5,6,7,8]. He and Lilley [6] investigated the influences of surface tension on the static bending of nanowires.

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