Timing with thin-film detectors in a perturbed angular correlations experiment

Abstract

Thin-film particle detectors in connection with NaI detectors have been used to measure time-differentially the perturbed particle-gamma angular correlation of projectile-excited 19 F-( 5 2 + ) in electric field gradients using a 19F beam from a tandem accelerator. The technique applied uses implantation of the excited projectile through vacuum. It results in a strong polarization of the nuclear state by the Coulomb excitation process which in connection with a noncubic single crystal is used to determine sign and magnitude of the electric quadrupole interaction.