Abstract

Test beam measurements have been carried out with a 3D sensor on a Timepix3 ASIC and the time measurements are presented. The measurements are compared to those of a thin planar sensor on Timepix3. It is shown that for a perpendicularly incident beam the time resolution of both detectors is dominated by the Timepix3 front-end. The 3D detector is dominated by the time-to-digital conversion whereas the analog front-end jitter also gives a significant contribution for the thin planar detector. The 3D detector reaches an overall time resolution of 567 ± 6 ps compared to 683 ± 8 ps for the thin planar detector. For a grazing angle beam, however, the thin planar detector achieves a better time resolution because it has a lower pixel capacitance, and therefore suffers less from jitter in the analog front-end for the low charge signals that mainly occur in this type of measurement. Finally, it is also shown that the 3D and thin planar detector can achieve time resolutions for large clusters of about 100 ps and 250 ps, respectively, by combining many single hit measurements.

Highlights

  • 683 ± 8 ps for the thin planar detector

  • The results show that some pixels only have 15 non-zero time bins: 0.49 % and 24.8 % for the 3D and thin planar detector, respectively

  • Using the track information to correct for time variations that are due to spatial dependence of the signal induction offers only about a 1 % improvement in the overall time resolution in measurements performed at perpendicular incidence

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Summary

Experimental setup

2.1 Description of sensors The 3D sensor technology differs from the planar technology by the geometry of the electrodes. For this pixel, a test pulse that is generated with a trigger delay of zero arrives in the fToA = 2 time bin — a trigger delay of zero is not necessarily aligned with a 40 MHz clock edge due to delays in the electronics and cabling. A pixel can still have an overall time offset due to (i) phase differences among pixels in the 40 MHz clock due to the clock distribution, and (ii) variations in the speed of the analog front-end due to the power distribution over the pixel matrix These offsets cannot be measured with test pulses because they themselves suffer from (unknown) differences in arrival time over the pixels due to their routing delays in the chip.

Perpendicular incidence
Findings
Conclusion
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