Abstract
The pulsed time structure, high intensity, and tight collimation of synchrotron x-ray sources provide new opportunities for the investigation of transient physical properties. The time structure of the x-rays from a synchrotron source is typically 150-ps long pulses separated by 300 ns. By triggering an experiment in sync with these x-ray bursts, measurements can be made with 150-ps resolution as long as the x-ray detector can resolve the 300-ns pulse spacing. Using streak cameras, time resolution down to picoseconds can be achieved by time resolving within a single bunch since the peak intensity within a bunch is ~3 × 1016 photons/s. Next generation sources such as an undulator at the Advanced Photon Source will be 100–1000 times brighter than presently available sources. Nanosecond studies of pulsed laser melting and regrowth of Si and Ge are described, and related experiments involving high-heat flow and supercooled liquid structure are discussed. Single shot crystallography and experiments using the pulsed time structure for neV energy resolution x-ray diffraction via Mossbauer transitions are also discussed.
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