Time-resolved x-ray diffraction measurements and analysis to investigate shocked lithium fluoride crystals

Abstract

Experimental methods to permit continuous, time-resolved x-ray diffraction measurements in plate impact experiments were developed and used to examine lattice deformation in shock compressed LiF single crystals. Using an x-ray streak camera diffraction data with 2–4 ns resolution were obtained from crystals subjected to both shock and ramp wave loading along the [111] direction. Because of the penetration depth of x rays into the sample, interpretation of the ramp wave loading data required an analytic model to simulate the results. The penetration depth used in the model was determined experimentally from the time-resolved shock wave loading data. Good agreement between the simulations and experimental data was found for both loading conditions, suggesting that the analytic model has broad applicability.