Abstract

In order to understand the structural changes in piezoelectric materials, under dynamic electric fields, time-resolved diffraction experiments with stroboscopic data collection techniques are becoming more popular. Uses of neutron and synchrotron X-ray facilities for such experiments have been recently reported. However, implementation of stroboscopic techniques on laboratory X-ray diffractometers is necessary to develop a more comprehensive understanding of time-resolved structural changes in these materials. Here the authors report the application of a stroboscopic data collection technique on a laboratory X-ray diffractometer for in situ characterization of non-180° domain switching in La-doped Pb(Zr0.52Ti0.48)O3 ceramics under dynamic electric fields. Further, the variation of macroscopic material response under dynamic fields of different amplitudes is compared with the degree of non-180° domain switching observed through time-resolved X-ray diffraction (XRD).

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