Abstract
The photoionization process in xenon clusters irradiated with a soft x-ray laser pulse (hν=89.2 eV, intensity: ~1010 W/cm2) was examined using a time-of-flight mass spectrometer, where the laser photon energy was high enough to ionize Xe 4d inner electrons (threshold: 67.55 eV for 4d5/2 and 69.54 eV for 4d3/2). The dominant ion yield resulting from Auger decay of 4d hole was Xe3+ ion. This showed that the double Auger transition probability would be enhanced in the cluster environments. In order to clarify the decay dynamics of 4d inner holes, the electron energy spectrum was measured. It was found that the distinct photo- and Auger electron lines were not observed, while the energy distribution implies the production of a low temperature cluster plasma.
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