Abstract
The time decay of thermoremanent magnetization (TRM) was studied for insulating random magnets Fe1−xMgxCl2 exhibiting both random field Ising model (RFIM) and Ising spin glass (SG) behaviors. The time dependence of TRM was found to be described over both cases with a functional form of MTRM(t)=AHνo[log(t/τ)]−φ.
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