Abstract
Compensation of errors from MicroElectroMechanical Systems (MEMS) inertial sensors is mandatory for real-world applications. Recently, several machine learning methods focused on dealing with nonlinear behaviors have been proposed to increase MEMS inertial sensors performance. However, manufacturers of MEMS inertial sensors claim that nonlinearity in these devices is negligible in most cases. This article provides a rigorous analysis of the viability of Time Delayed Multiple Linear regression technique (TD-MLR) for decreasing white noise observed in MEMS inertial sensors. TD-MLR is evaluated on four MEMS inertial measurement units and compared to two well-known methods with different complexity levels, i.e., Moving Average (MA) filtering and the Multi Layer Perceptron (MLP). A strong statistical framework is applied on the three methods to guarantee that optimal models are obtained during the adjustment phase. Experimental results show that no significant statistical differences exist between TD-MLR and MLP. In addition, TD-MLR proves to be a remarkable improvement over MA.
Published Version
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