Abstract
Alpha particle bombardment of a Si surface-barrier detector in vacuum causes the release of several species of ions from the contaminant layer on the detector surface. The mass-to-charge ratios of the ions are determined by time-of-flight spectroscopy. A significant fraction of the ions are H+ with a yield of 4×10−5 H+ per alpha particle and an emission energy of less than 70 eV. This ion source could be useful for testing slow μ+ collection optics and possibly for studying the diffusion of H atoms in liquid He.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
