Time response demonstration of in situ lattice deformation under an applied electric field by synchrotron-based time-resolved X-ray diffraction in polar-axis-oriented epitaxial Pb(Zr,Ti)O3 film

Abstract

The dependence of applied rectangular pulses with various widths on the crystal structure change was investigated by time-resolved synchrotron-based X-ray diffraction measurement. A (001)-oriented epitaxial Pb(Zr0.5Ti0.5)O3 film of 2.1 µm thickness grown on a (100)cSrRuO3//(100)LaNiO3//(100)CaF2 substrate by metal organic chemical vapor deposition was investigated. The crystal lattice increased almost linearly with increasing applied electric field up to 230 kV/cm in the case of a 0.3-µs-width pulse. This elongation with the application of an electric field was ascertained to be almost independent of the pulse width from 0.3 to 2000 µs at 190 kV/cm. These values were almost consistent with the macroscopic measurements obtained at 5 and 1000 Hz by piezoelectric force macroscopy. The present results show that the time-resolved XRD measurement is very useful for analyzing the frequency dependence of the piezoelectric response in view of the crystal structure change because the crystal structure change under an applied electric field can be systematically investigated by changing the applied pulse width.