Abstract

The design and the atomic composition of Charge Coupled Devices (CCDs) make them unique for investigations of single energetic particle events. As detector system for ionizing particles they detect single particles with local resolution and near real time particle tracking. In combination with its properties as optical sensor, particle transversals of single particles are to be correlated to any objects attached to the light sensitive surface of the sensor by simple imaging of their shadow and subsequent image analysis of both, optical image and particle effects, observed in affected pixels. As semiconducting storage devices of high charge sensitivity with an atomic composition and structure being similar to charge sensitive memory devices, CCDs permit to investigate single particle effects in microprocessor and memory devices, minor effects as well as those causing fatal errors and malfunctions by changing charge states (Single Event Upsets) in complex particle radiation fields, such as in space. For calibration purpose of the CCD as particle detector, radiation effects of ionizing particles in the pixels have been quantified. Applications are presented in the field of radiobiology with metabolizing seedlings of Arabidopsis thaliana and with the investigation of single particle events in high integrated electronic components in space radiation fields.

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