Abstract
Polarization reversal measurement in ferroelectric NaNO2 has been carefully carried out by using a repetitional pulsed X-ray diffractometer system developed for a time-dependent structure analysis. It is found that the X-ray scattering in- tensity of the (150) reflection which is sensitive to the polarization decreases and the width of the reflection increases after a sudden change of external electric field. It is clarified that domain wall or interface has a crucial role in nucleation-growth process. The mechanism of domain switching is discussed in terms of the characteristic times such as delay time and metastable time.
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