Time-resolved X-ray diffraction study of C 60 at high pressure and temperature

Abstract

Energy-dispersive X-ray diffraction measurements on C 60 were undertaken at every 1–10 min interval while high temperature (200–800°C) was held constant for at longest 3 h under pressures of 12.5 and 14.3 GPa. The results from this and additional experiments have provided an insight into the time, pressure, and temperature dependency of the fullerene-derived superhard materials.