Abstract
Time-resolved fluorescence is used to monitor the relaxation dynamics of minority carriers in n-type CdSe semiconductor electrodes. Five different silane compounds are used to chemically modify the interface and change the surface recombination velocity. In order to quantitate the interfacial recombination of charge carriers, a perturbative solution of a nonlinear diffusion equation is developed. These studies are combined with surface analysis and electrochemical studies to identify the nature of the chemically derivatized interface and characterize its electrical properties. This work clearly demonstrates the strong effects of surface treatment on the charge carrier dynamics and the sensitivity of fluorescence in monitoring the dynamics
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
