Time-resolved measurements of x-ray damage to optical coatings

Abstract

Thin film optical coatings are susceptible to damage by high intensity x rays. Time-resolved measurements of this damage are required to better understand the mechanism, so that more rugged coatings can be developed. In the present experiment, dark-field shadowgraphy was used to temporally map the x-ray damage across the surface of certain anti-reflecting (AR) coatings. Two beams from the NRL PHAROS III high power Nd:glass laser system were utilized to generate a point source of plasma x rays, which in turn was used to irradiate and damage the optical coatings. Thin, opaque filters, coupled with permanent magnets and pinholes, were used to shield the optical samples from ultraviolet and charged-particle damage, respectively. The absolute, time-integrated x-ray fluence was measured with a crystal spectrograph, and also was temporally resolved with an x-ray diode. The surface morphology of the damaged optical samples was examined after each shot visually, and later with a profilometer as well as with both scanning electron- and atomic-force microscopes. A measured threshold fluence for damage of 0.049±30% cal/cm2 agrees very well with a radiation-damage code prediction of 0.046 cal/cm2.