Abstract
A sampling technique with pulsed probe bias is described which enables time-resolved electron energy distribution measurements to be made in higher-current discharges (similar 300 mA cm−2) in which the probe would normally become incandescent. The method enables the probe temperature to be significantly reduced, eliminating errors due to large variations of the probe surface workfunction and thermal emission. The method is illustrated with measurements made in a neon discharge operating above the Pupp limit.
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