Time-Resolved Digital Image Correlation in the Scanning Electron Microscope for Analysis of Time-Dependent Mechanisms

Abstract

Background: Advancements in the Digitial Image Correlation (DIC) technique over the past decade have greatly improved spatial resolution. However, many processes, such as plastic deformation, have a temporal component spanning from fractions of a second to minutes that has not yet been addressed in detail, particularly for DIC conducted in-situ in the scanning electron microscope (SEM). Objective: To develop a methodology for conducting time-resolved digital image correlation in the SEM for analysis of time-dependent mechanical deformation phenomena. Methods: Microscope and electron beam scanning parameters that influence the rate at which time-resolved DIC information is mapped are experimentally investigated, providing a guide for use over a range of timescales and resolutions. Results: Time-resolved DIC imaging is demonstrated on a Ti-7Al alloy, where slip band propagation is resolved with imaging dwell times of seconds. The limits of strain resolution and strain collection speeds are analyzed. Conclusions: The new developed methodology can be applied to a wide range of materials loaded in-situ to quantify time-dependent plastic deformation phenomena.