Abstract

A position sensitive detection system based on the microchannel plate detector has been constructed and installed at the existing time of flight (TOF) spectrometer in order to perform a kinematic correction and improve the surface time/depth resolution of elastic recoil detection analysis (ERDA) system. The position resolution of the detector has been tested for different types of ions and anode voltages. TOF spectra of recoiled O ions from SiO(2) and F from CaF(2) were collected in coincidence with position sensitive detector signal. Kinematic correction of TOF spectra improved surface time/depth resolution by approximately 20% for our system; however even higher improvements could be obtained in larger solid angle TOF-ERDA systems.

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