Abstract
Ultrafast absorption saturation in an exciton Bragg reflector, consisting of InGaAs quantum wells embedded in InP/InGaAsP Bragg layers, is characterized by pump-induced transient reflectance spectroscopy at room temperature. Spectral modulation of the reflected probe pulses is caused by ultrafast absorption saturation of excitons in the quantum wells. The spectral modulation leads to an optical phase shift of 1.6 π. The exciton-induced phase shift is more than four times as large as that induced by free carriers in a Bragg reflector.
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