Abstract
Transmission electron microscopy (TEM) and low-energy electron diffraction (LEED) simulations are performed by propagating electron wave packets in real space and real time. The method accurately describes electron scattering in solids for high ($>$200 keV) and low (20--200 eV) energies. The applicability of the method is demonstrated by calculating TEM images and LEED intensities of silicon and graphene.
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