Abstract
With thin-film head/media systems, frequency-domain parametric measurements (SNR, resolution, decibel overwrite, etc.) often demonstrate poor correlation with actual disk-drive phase margin results. Superposition modeling and direct time-domain measurements are required to understand these systems better. Several techniques are discussed: time-domain quantification of individual read and media noise, aggregate noise and offset deconvolution from phase margin graphs, and time-domain writeability measurements. Applications of these techniques include characterization of phenomena unique to thin-film systems, optimization of disk-drive electronics using these systems, and the creation of improved component and drive production tests. >
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