Time and temperature resolved X-ray diffraction for studies of solid state reactions and phase transitions

Abstract

Three examples for the application of time and temperature resolved X-ray diffraction for the investigation of solid state reactions and phase transitions are given. Samples were submitted to an isothermal temperature program or to stepwise heating/cooling, while diffraction patterns were measured continuously. The applications include the in situ identification of reaction products or phases, the determination of kinetic parameters, the observation of thermal expansion and the formation of layers.