Time analogue of the z-scan technique suitable to waveguides

Abstract

We propose a new technique to perform measurements of nonlinearities in optical waveguides based on the variation of an optical pulse chirp. This technique is analogous to the z-scan technique in the time domain. We analyze the new experimental method analytically and numerically, obtaining an useful expression relating the nonlinearity with a peak-valley structure. Practical ways to implement the technique are discussed.