Abstract
To achieve super-resolution imaging, the information in higher frequency of the observed sample is collected by illuminating with a structure beam for a limited optical transfer function. In this paper, tilt illumination mode is introduced to structured illumination microscopy (SIM) for enhancing lateral resolution. More sample spectrum more than traditional SIM, can be obtained by detector. Thus, SIM with tilt illumination can be improved at the aspect of lateral imaging resolution.
Highlights
Structured illumination microscopy (SIM) is a tool of super-resolution imaging
SIM has been widely used in optical sectioning, phase imaging, and 3D surface measurement [7]
The third-order Nonlinear SIM (NSIM) can obtain much more high frequency spectrum. tiSIM is by rotating illumination beam to detect high frequency without high density laser
Summary
Structured illumination microscopy (SIM) is a tool of super-resolution imaging. In 2000, Gustafsson optimized the generation mode of sinusoidal structured light for illumination [1], which successfully has a double resolution in some imaging systems [2, 3, 4, 5, 6]. In SIM, a sinusoidal modulated intensity pattern is used by moving spectrum for capturing the high frequency data. The saturated structured illumination microscopy (SSIM) [19, 20] was introduced to improve resolution by utilizing the nonlinear effect of fluorescent molecules. Tilt illumination is introduced to SIM (tiSIM) for enhancing resolution. The mathematical model of tilt illumination is an exponential function in object reconstruction This function is used to shift spectrum. The theoretical analysis and simulation results are given to validate the performance of tiSIM
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