TIARA: Industrial Platform for Monte Carlo Single-Event Simulations in Planar Bulk, FD-SOI, and FinFET

Abstract

In this article, we present Tool suIte for rAdiation Reliability Assessment (TIARA), an industrial version of a Monte Carlo single-event simulation platform, enabling fast and accurate soft error rate (SER) estimations. This tool is capable of simulating logic cells manufactured in several technologies such as fully depleted silicon on insulator (FD-SOI), FinFET, and planar bulk CMOS. Moreover, TIARA is able to handle many different types of radiations including by-products of neutron or proton spallation, heavy ions and alpha particles, representative of terrestrial and space environments. Three use cases are shown in this article to illustrate TIARA capabilities. The first one compares the error rate in Geostationary Earth Orbit (GEO) orbit of all flip-flop variants from a 28-nm FD-SOI library. Second one evaluates multiple-cell upsets as a function of simulated array size for static random access memory (SRAM) cells manufactured in a 40-nm bulk technology. The last one shows alpha and neutron SER results for SRAM designed in a bulk-FinFET technology.