Abstract
0.05AlPO4-0.05BPO4-0.90SiO2 glass-ceramic and glass-free 0.45AlPO4-0.45BPO4-0.10SiO2 ceramic have been prepared by a solid-state reaction process and their terahertz (THz) dielectric responses were characterized by time-domain spectroscopy (TDS) techniques in the frequency range from 0.2 to 1.6 THz. Both samples demonstrate little dielectric dispersions in the (sub) THz frequency range, having dielectric permittivities (εr) of ∼3.35(7) and ∼4.06(8), respectively. The dielectric responses are dominated by the phonons and electronic polarizations in the (sub) THz frequency range. The contributions to the relative permittivities from electronic polarization εr ∞ are 1.85(4) and 1.99(4), which are ∼55% and ∼49% of the total εr at THz frequencies, respectively. The dielectric losses of both samples continuously increase with increasing frequency in the THz band, while the loss factor of glass-ceramic is one order of magnitude higher than that of glass-free ceramic. The glass-free sample exhibits extremely high Q×f values of 100,000–190,000 GHz in the THz band, being much higher than that of the glass-ceramic (∼7000–25,000 GHz).
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