Abstract
High dose irradiation effects of gamma-rays up to 17 MGy (H2O) on 4H-SiC junction field effect transistors (JFETs) were investigated. Due to the irradiation, gradual positive threshold voltage (Vth) shift as high as 0.5 V and continuous decrease in transconductance gm were observed. In addition, Vth instability and hysteresis appeared for the irradiated JFETs when the gate voltage (VG) sweep direction, sweep interval, i.e., averaged sweeping rate, sweep range, and delay time were changed. Increase of VG interval attributed to positive Vth shift for both forward and reverse directions, whereas narrowing of sweep range and increase of delay time resulting in a more noticeable negative shift of Vth for the reverse direction. Such Vth hysteresis indicates that capture and release of carriers predominantly took place via hole traps formed around the gate region due to high dose gamma-ray irradiation.
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