Three-dimensional birefringence imaging with a microscope tilting stage. II. Biaxial crystals

Abstract

The technique enables precise three-dimensional birefringence information of optically biaxial materials to be obtained. Equations derived here describe a mathematical model of the tilting-stage system for such crystals in any general orientation. This leads to precise values of the three principal birefringences and the optical orientation. The method is also able to obtain information on preferred orientation in a biaxial polycrystalline material, providing comprehensive information on both optical orientation of crystallites and spatial resolution. In addition, an unknown crystalline material may be identified, or at least classified within a specific group of crystalline materials.