Abstract
A model for analysing the phase sensitivity of the reflection coefficients of a diffracted wave in the case of three-wave X-ray diffraction is proposed. This model considers three-wave diffraction as the interference of the directly excited and the Umweg-excited diffracted waves and seems to account properly for the phase sensitivity as well as the behaviour of an involved diffracted wave as a function of the triplet phase invariant, the polarization state of the incident wave and the diffraction geometry. The practical issues for phase determination are also considered.
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Schedule a callMore From: Acta crystallographica. Section A, Foundations of crystallography
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