Abstract
Flux spreading in thin-film recording heads has been studied using a three-dimensional transmission line model. This model uses the observed domain wall structure in a thin-film head as the map on to which a set of electrical circuit nodes in the model are placed. These nodes are connected in the transverse direction by inductive circuit elements which simulate the domain wall mobility for transverse flux conduction by wall motion. In the longitudinal direction skin-effect-limited conduction by magnetization rotation is simulated by a R/L series element. At frequencies above 8 MHz this model begins to exhibits a concentration of flux on the axis of the head.
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