Abstract
An etching model in which topography is derived by solving a modified diffusion equation is introduced. This model is simple and makes it possible to simulate three-dimensional (3-D) topography accurately and quickly. Based on this model, a 3-D topography simulator which can be applied in the development of photolithography and isotropic/anisotropic etching has been developed. With this simulator, it is possible to simulate the series processes and multilayer etching, such as contact hole and trench etching. By simulating photolithography, diffraction and standing-wave effects can be found clearly in the 3-D topography of the developed photoresist. In the case of an etching process which is restricted by diffusion, the dependence of the etch front topography on the window width of the mask is examined.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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