Abstract
In this paper a measurement method of three-dimensional profiles and a reconstruction system using subpixel localization with color gratings projection is described. The system has the effects of identical contrast on gratings for easier identification, switchable picture-in-picture on the display, and adjustable gratings with an adjustment module. The measurement method includes the following: the projection step; image extraction step; image fine-tuning step; subpixel localization processing step; and reconstruction step. A projection apparatus emits a grating towards a small lens under measurement, and forms a grating image on the small lens under measurement. The contrast values of the plurality of grating stripes of the grating image are identical. The grating image and picture-in-picture of a display can be fine-tuned and reconstruct the three-dimensional profiles of the small lens. This method can help improve measurement competence in the reverse engineering industry.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Optik - International Journal for Light and Electron Optics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
