Abstract
In this paper, a microwave imaging method able to inspect three-dimensional configurations is proposed. The approach is developed in $L^{p}$ Banach spaces, and allows to suitably face the ill-posedness of the considered full vector inverse scattering problem. The assumed nonconventional spaces require several modifications in the original inexact-Newton scheme, which give rise to a significant improvement in reducing the oversmoothing effects in the reconstructed distributions of the dielectric properties of the targets. The proposed approach is discussed in details and validated by using both numerical simulations and real data.
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