Abstract
One of the main problems connected with the exploitation of CdTe and CdZnTe crystals for the preparation of X-ray imaging devices is the presence in the matrix of inclusions, mainly due to tellurium excess. It is important to set up characterization methods that permit one to map in three dimensions the presence and the diameter of inclusions. This is a key point for (both) a better understanding of the inclusion-formation mechanism and for the evaluation of crystal quality. For this purpose, we developed a system that can be implemented on standard transmission optical microscopes. The use of this tool in the characterization of Bridgman grown CdZnTe samples allowed us to uncover interesting features in the tellurium inclusion distribution.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
