Abstract
Crystallographic orientation of individual grains on the surface of the thick specimen was successfully determined by polarized Raman spectroscopy.(1) Depth resolution of a few μm in Raman-microprobe polarization was achieved using a high-magnification objective lens and a pinhole plate. This enables determination of the crystallographic orientation of single grains in ceramics.(2) Raman tensor elements of sapphire, c and d, belonging to the Eg mode were analyzed. The analysis leads to c>>d for 378cm-1 line. As a result, the intensity of Raman scattering was expressed as S378cm-1//∝{1-sin2θcos2(φ-φExp)}sin2θ×cos2(φ-φExp).(3) Three-dimensional c-axis orientations of translucent alumina grains were successfully determined by polarized Raman lines at 645 and 378cm-1.
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