Abstract
Y1-xGdxBa2Cu3O7-yfilm with BaZrO3was fabricated on CeO2buffered LaMnO3/ion beam assisted deposition MgO/Gd2Zr2O7/Hastelloy C276TMsubstrates by the trifluoroacetates metal organic deposition process, whose microstructural and elemental analyses were performed by transmission electron microscopy. Y1-xGdxBa2Cu3O7-yfilm with the thickness about 700 nm was found composed of c-axis oriented grains and large numbers of randomly oriented precipitates, such as (Y,Gd)2Cu2O5, CuO and BaZrO3. (Y,Gd)2Cu2O5and CuO precipitates were heterogeneously dispersed in the Y1-xGdxBa2Cu3O7-ymatrix with their sizes ranging between 100 and 200 nm, and BaZrO3precipitates were uniformly dispersed with their sizes ranging between 10 and 20 nm. Electron tomography with elemental information was performed further to reveal the three-dimensional information of BaZrO3 precipitates.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
