Abstract
The authors proposed a plausible explanation for the deviation of experimental data for sub-micron polycrystals from the Hall-Petch relation by introducing the configuration entropy. The present paper extends the previous two-dimensional analysis to the three-dimensional case. The statistical distribution of dislocation lengths within a spherical grain and the bow-out of dislocations are considered. According to Ashby's model, analyses are pursued for the statistically stored dislocations and geometrically necessary dislocations, respectively. It is confirmed that the configuration entropy model can predict the abnormal Hall-Petch dependence for grain sizes in the sub-micron range.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
