Abstract
The (Cd0.9, Mn0.1)Te crystal was grown by the Traveling Heater method (THM) from the indium-doped source ingot (Cd0.9, Mn0.1)Te which had been synthesized by the Vertical Bridgman (VB) method. The indium-doped (Cd0.9, Mn0.1)Te single crystal with the diameter of 31mm and length of 130mm was obtained. The variation of the Mn content was about ±1% along the length of (Cd, Mn)Te: In ingot, and the concentration of Te inclusions in the crystal was ~104cm−3 with the average diameter of 8–12μm. Te solvent showed purifying effects during the THM crystal growth, and the indium dopant distributed along the crystal with the concentration of 6.8–10ppm. IR transmittance and PL spectrum measurements revealed that the as-grown (Cd, Mn)Te crystal possessed high crystalline quality, and its resistivity was up to 6.2×109Ωcm. Under the 59.5keV 241Am irradiation, the planar (Cd, Mn)Te detector showed an energy resolution of 12.7%.
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