Abstract
Thin films of fluorides with lattice parameters close to both GaAs and InP, have been obtained by sublimation under vacuum of solid solution powders of Sr 1− x Ca x F 2 and Ba 1− x Sr x F 2 respectively. This paper deals with the characterization of the insulating layers. The crystallization state, the composition and the energy band gap of the films have been deduced from X-ray diffraction, RBS and optical absorption studies performed on thin films which were deposited on glass, carbon and MgF 2 single-crystal substrates respectively. The electrical characteristics of the fluorides were obtained from MIM structures.
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