Abstract
We have used spectroscopic ellipsometry in the photon energy range 1.5–2.5 eV to determine the dielectric function of thin films (3–30nm) of undoped poly(3-hexylthiophene) prepared with a spinning technique on gold substrates. We have observed characteristic absorption peaks in the energy range 2–2.5 eV. By means of second derivative lineshape fitting, we demonstrate that it is possible to quantitatively extract values on model parameters like peak energies, linewidths and oscillator strengths. We also show how light-induced degradation changes the polymer as reflected in the dielectric response of the polymer.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
