Thin film scintillation detectors for evaporation residue detection: angular distributions and coincidence trigger

Abstract

A thin film scintillation detector has been used to measure the angular distribution of evaporation residues from the reaction 142 MeV 32S + 27Al. Measurements were carried out from 5° to 30° with respect to the beam. Good separation of heavy residues from elastic scattering was demonstrated by two dimensional scatter plots of time-of-flight versus light output, even for positions well inside the grazing angle. The angular distributions compare very well with published data obtained with silicon semiconductor detectors. The ability to withstand radiation and give good separation of residues from elastics, even at high count rates, makes the thin film scintillation detector an excellent trigger for coincidence experiments.