Abstract
Descriptive and robust features based on wavelet transform coefficients are proposed for a multiscale thin film image analysis. The features are based on one- and two-dimensional histograms of the wavelet transform coefficients and they can be calculated for every scale of the wavelet decomposition. A one-dimensional histogram model is extended to describe also two-dimensional histograms, by means of calculating marginal histograms and by sampling the two-dimensional histograms in orientation. A computer experiment has been performed to demonstrate correspondence of the derived features to various physical phenomena.
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