Abstract
Thin transparent dielectric films containing Tb3+ are developed for application as spectral converters of the solar spectrum in thin film silicon solar cells. The results on the deposition and characterization of thin SiO2 and Al2O3 films containing Tb3+ ions are presented. The films are prepared by RF magnetron co‐sputtering, a well established technique for large area coatings. Photoluminescence (PL) is measured at room temperature, using the 488 nm line of an Ar laser and a nitrogen‐cooled CCD camera attached to a monochromator. The dependence of the PL intensity on the concentration of Tb in the film is studied. It is found that the intensity exhibits a maximum at about 1 at.%. Annealing studies are performed on SiO2:Tb with two different methods to improve the PL intensity. In both regimes of annealing, the best results for thin SiO2:Tb films are obtained in the temperature range of 650–700° C. After treatment at this temperature the Tb PL increases 2.5–3 times.
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