Thin crystal as a new X-ray spectroscopic device

Abstract

Astronomische NachrichtenVolume 320, Issue 4-5 p. 380-380 Original Paper Thin crystal as a new X-ray spectroscopic device H. Ogata, H. Ogata Department of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama-cho, Toyonaka, Osaka 560-0043, JapanSearch for more papers by this authorS. Kitamoto, S. Kitamoto Department of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama-cho, Toyonaka, Osaka 560-0043, JapanSearch for more papers by this author H. Ogata, H. Ogata Department of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama-cho, Toyonaka, Osaka 560-0043, JapanSearch for more papers by this authorS. Kitamoto, S. Kitamoto Department of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama-cho, Toyonaka, Osaka 560-0043, JapanSearch for more papers by this author First published: 03 July 2001 https://doi.org/10.1002/1521-3994(199908)320:4/5<380::AID-ASNA380>3.0.CO;2-WAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL No abstract is available for this article. Volume320, Issue4-5August 1999Pages 380-380 RelatedInformation