Abstract

In this work, an attempt has been made to develop thin and flexible transparent conductors based on the interfaces of Ag nanoparticles (AgNP) and Al:ZnO (AZO) deposited by sequential magnetron sputtering. The entire deposition process is completed within 20–28 min without breaking vacuum thereby preventing post-deposition oxidation of Ag NPs. The co-existence of high transmittance and low sheet resistance along with stability under mechanical bending is a bit difficult to achieve in bare AZO thin film having thickness below 200 nm. The resistivity of the optimized AZO/AgNP/AZO composite structure is significantly low at 3.3 × 10−5 Ω cm, which is two orders lower than that of AZO thin film of similar thickness. The figure of merit of the optimized composite structure peaks at 39.0 mΩ−1 corresponding to Ag NPs growth period of 5 min. The novel fabrication of AZO/AgNP interface in a dry and vacuum environment facilitates superior bending stability required for a flexible transparent conductor. The findings suggest that a system of two thin layers of AZO with embedded Ag NPs can be a potential candidate as an indium free transparent conductor for the next generation optoelectronic device.

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